Monitoring of argon content in materials
It is reported the possibility of monitoring the presence of argon in the surface layer of materials using the fluorescent emission of characteristic K X-rays of argon by irradiation of the surface of the materials with low energy X-rays. The low energy of these characteristic X-rays, 2,97 keV, make...
| Authors: | ; |
|---|---|
| Format: | Article |
| Status: | Published version |
| Publication date: | 2013 |
| Country: | Perú |
| Institution: | UNMSM |
| Repository: | Revistas - Universidad Nacional Mayor de San Marcos |
| Language: | Spanish |
| OAI Identifier: | oai:revistasinvestigacion.unmsm.edu.pe:article/8657 |
| Online Access: | https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/8657 |
| Access Level: | Open access |
| Keyword: | Monitoring argon X-ray fluorescence materials surface. Monitoreo argón fluorescencia de rayos X materiales superficie. |
| _version_ | 1878411308680871936 |
|---|---|
| author | Bravo Cabrejos, J. A. |
| author2 | Mejía Santillán, M. E. |
| author2_role | author |
| author_browse | Bravo Cabrejos, J. A. Mejía Santillán, M. E. |
| author_facet | Bravo Cabrejos, J. A. Mejía Santillán, M. E. |
| author_role | author |
| collection | Revistas - Universidad Nacional Mayor de San Marcos |
| description | It is reported the possibility of monitoring the presence of argon in the surface layer of materials using the fluorescent emission of characteristic K X-rays of argon by irradiation of the surface of the materials with low energy X-rays. The low energy of these characteristic X-rays, 2,97 keV, makes possible to monitor the presence of argon down a depth of some five microns. |
| eu_rights_str_mv | openAccess |
| format | article |
| id | PE_5900a03bf4e7be49b21c5e12d155d10a |
| identifier_str_mv | 10.15381/rif.v16i01.8657 |
| institution | UNMSM |
| instname_str | Universidad Nacional Mayor de San Marcos |
| language | spa |
| network_acronym_str | PE |
| network_name_str | Perú |
| oai_identifier_str | oai:revistasinvestigacion.unmsm.edu.pe:article/8657 |
| publishDate | 2013 |
| publishDateSort | 2013 |
| publisher | Universidad Nacional Mayor de San Marcos |
| publisherStr | Universidad Nacional Mayor de San Marcos |
| reponame_str | Revistas - Universidad Nacional Mayor de San Marcos |
| spelling | Monitoring of argon content in materials Monitoreo del contenido de argón en los materiales Bravo Cabrejos, J. A. Mejía Santillán, M. E. Monitoring argon X-ray fluorescence materials surface. Monitoreo argón fluorescencia de rayos X materiales superficie. It is reported the possibility of monitoring the presence of argon in the surface layer of materials using the fluorescent emission of characteristic K X-rays of argon by irradiation of the surface of the materials with low energy X-rays. The low energy of these characteristic X-rays, 2,97 keV, makes possible to monitor the presence of argon down a depth of some five microns. Se reporta la posibilidad de monitorear de manera cuantitativa la presencia de argón en la capasuperficial de los materiales utilizando la emisión fluorescente de los rayos-X característicos tipo K deargón producidos por irradiación de la superficie del material con rayos X de baja energía. La bajaenergía de estos rayos-X K, 2.97 keV, hace posible monitorear la presencia de este elemento hasta unaprofundidad de unos 5 micrones. Universidad Nacional Mayor de San Marcos https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/8657 10.15381/rif.v16i01.8657 |
| spellingShingle | Monitoring of argon content in materials Bravo Cabrejos, J. A. Monitoring argon X-ray fluorescence materials surface. Monitoreo argón fluorescencia de rayos X materiales superficie. |
| status_str | publishedVersion |
| title | Monitoring of argon content in materials |
| title_full | Monitoring of argon content in materials |
| title_fullStr | Monitoring of argon content in materials |
| title_full_unstemmed | Monitoring of argon content in materials |
| title_short | Monitoring of argon content in materials |
| title_sort | Monitoring of argon content in materials |
| topic | Monitoring argon X-ray fluorescence materials surface. Monitoreo argón fluorescencia de rayos X materiales superficie. |
| topic_facet | Monitoring argon X-ray fluorescence materials surface. Monitoreo argón fluorescencia de rayos X materiales superficie. |
| url | https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/8657 |