Topological sensitivity for solving inverse multiple scattering problems in three-dimensional electromagnetism. Part I: One step method

Bibliographic Details
Authors: Rapun Banzo, Maria Luisa|||0000-0001-5787-5252; Le Louer, Frederique
Format: Article
Publication date:2017
Country:España
Institution:Universidad Politécnica de Madrid
Repository:Archivo Digital UPM
OAI Identifier:oai:oa.upm.es:50240
Online Access:https://oa.upm.es/50240/
Access Level:Open access
Keyword:Electromagnetism
topological derivative
inverse obstacle scattering problems
shape reconstruction
Description
Description not available.