Atomic force microscopy: probing the nanoworld
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
| Authors: | ; |
|---|---|
| Format: | Book chapter |
| Status: | Published version |
| Publication date: | 2012 |
| Country: | España |
| Institution: | Universidad de Barcelona |
| Repository: | Dipòsit Digital de la UB |
| OAI Identifier: | oai:diposit.ub.edu:2445/32162 |
| Online Access: | https://hdl.handle.net/2445/32162 |
| Access Level: | Open access |
| Keyword: | Microscòpia de força atòmica Nanotecnologia Anàlisi instrumental Atomic force microscopy Nanotechnology Instrumental analysis |
| _version_ | 1878730555466448896 |
|---|---|
| author | Oncins Marco, Gerard |
| author2 | Díaz Marcos, Jordi |
| author2_role | author |
| author_browse | Díaz Marcos, Jordi Oncins Marco, Gerard |
| author_facet | Oncins Marco, Gerard Díaz Marcos, Jordi |
| author_role | author |
| collection | Dipòsit Digital de la UB |
| description | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 |
| eu_rights_str_mv | openAccess |
| format | bookPart |
| id | ES_1ea8dd3f35d4f63ee76a7e1fd2a483bf |
| institution | Universidad de Barcelona |
| instname_str | Universidad de Barcelona |
| network_acronym_str | ES |
| network_name_str | España |
| oai_identifier_str | oai:diposit.ub.edu:2445/32162 |
| publishDate | 2012 |
| publishDateSort | 2012 |
| publisher | Centres Científics i Tecnològics. Universitat de Barcelona |
| publisherStr | Centres Científics i Tecnològics. Universitat de Barcelona |
| reponame_str | Dipòsit Digital de la UB |
| spelling | Atomic force microscopy: probing the nanoworld Oncins Marco, Gerard Díaz Marcos, Jordi Microscòpia de força atòmica Nanotecnologia Anàlisi instrumental Atomic force microscopy Nanotechnology Instrumental analysis Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments. Centres Científics i Tecnològics. Universitat de Barcelona https://hdl.handle.net/2445/32162 |
| spellingShingle | Atomic force microscopy: probing the nanoworld Oncins Marco, Gerard Microscòpia de força atòmica Nanotecnologia Anàlisi instrumental Atomic force microscopy Nanotechnology Instrumental analysis |
| status_str | publishedVersion |
| title | Atomic force microscopy: probing the nanoworld |
| title_full | Atomic force microscopy: probing the nanoworld |
| title_fullStr | Atomic force microscopy: probing the nanoworld |
| title_full_unstemmed | Atomic force microscopy: probing the nanoworld |
| title_short | Atomic force microscopy: probing the nanoworld |
| title_sort | Atomic force microscopy: probing the nanoworld |
| topic | Microscòpia de força atòmica Nanotecnologia Anàlisi instrumental Atomic force microscopy Nanotechnology Instrumental analysis |
| topic_facet | Microscòpia de força atòmica Nanotecnologia Anàlisi instrumental Atomic force microscopy Nanotechnology Instrumental analysis |
| url | https://hdl.handle.net/2445/32162 |