Cita APA (7a ed.)
Maya Sánchez, M. d. C., Lázaro Guillén, A., & Pradell i Cara, L. (2004). Noise model of a reverse-biased Cold-FET applied to the characterization of its ENR. JOHN WILEY & SONS INC.
Cita Chicago Style (17a ed.)
Maya Sánchez, Mª del Carmen, Antoni Lázaro Guillén, y Lluís|||0000-0003-4026-226X Pradell i Cara. Noise Model of a Reverse-biased Cold-FET Applied to the Characterization of Its ENR. JOHN WILEY & SONS INC, 2004.
Cita MLA (9a ed.)
Maya Sánchez, Mª del Carmen, et al. Noise Model of a Reverse-biased Cold-FET Applied to the Characterization of Its ENR. JOHN WILEY & SONS INC, 2004.
Precaución: Estas citas no son 100% exactas.