Escobar-Galindo, R., Gago, R., Forniés, E., Muñoz Martín, Á., Climent Font, A., & Albella Martín, J. M. (2006). Nanometric resolution in glow discharge optical emission spectroscopy and Rutherford backscattering spectrometry depth profiling of metal (Cr, Al) nitride multilayers. ScienceDirect.
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Cita Chicago Style (17a ed.)
Escobar-Galindo, Ramón, Raúl Gago, E. Forniés, Ángel Muñoz Martín, Aurelio Climent Font, y José María Albella Martín. Nanometric Resolution in Glow Discharge Optical Emission Spectroscopy and Rutherford Backscattering Spectrometry Depth Profiling of Metal (Cr, Al) Nitride Multilayers. ScienceDirect, 2006.
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Cita MLA (9a ed.)
Escobar-Galindo, Ramón, et al. Nanometric Resolution in Glow Discharge Optical Emission Spectroscopy and Rutherford Backscattering Spectrometry Depth Profiling of Metal (Cr, Al) Nitride Multilayers. ScienceDirect, 2006.
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